Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry-Reference-Cited by-同舟云学术

Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry

Published:2000-10-01 Issue:10 Volume:39 Page:2821
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Li Xide

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference19 articles.

1. T. Kreis, “Processing of the interference phase,” Chap. 5 inHolographic Interferometry, pp. 245–257, Springer-Verlag, Berlin (1996).

2. Wavelets and signal processing

3. I. Daubechies,Ten Lectures on Wavelets, SIAM, Philadelphia (1992).

4. C. K. Chui,An Introduction to Wavelets, Academic Press, San Diego (1992).

5. Two-dimensional wavelet transform and application to holographic particle velocimetry

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