Semi-insulating CdZnTe with improved structural perfection for radiation detector applications
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SPIE
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. What causes high resistivity in CdTe;New Journal of Physics;2012-06-15
2. Characterization of etch pit formation via the Everson-etching method on CdZnTe crystal surfaces from the bulk to the nanoscale;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2011-10
3. Characterization of secondary phases and other defects in CdZnTe;SPIE Proceedings;2010-08-19
4. Characterization of detector-grade CdZnTe crystals grown by traveling heater method (THM);Journal of Crystal Growth;2010-02
5. Characterization of heterogeneities in detector-grade CdZnTe crystals;Journal of Materials Research;2009-04
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