Metrology of thin transparent optics using Shack-Hartmann wavefront sensing
Author:
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference36 articles.
1. Precision shaping, assembly and metrology of foil optics for x-ray reflection gratings
2. Optical testing using Shack-Hartmann wavefront sensors
3. ADE Phase-Shift. 3470 E. Universal Way, Tucson, AZ 85706.
4. White-light Fizeau interferometer
5. New measurement system for fault location in optical waveguide devices based on an interferometric technique
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