Development of surface profile measurement method for ellipsoidal x-ray mirrors using phase retrieval-Reference-Cited by-同舟云学术

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Development of surface profile measurement method for ellipsoidal x-ray mirrors using phase retrieval

Published:2012-10-19 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Saitou Takahiro,Takei Yoshinori,Mimura Hidekazu

Publisher

SPIE

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Three-dimensional shape measurement of an ellipsoidal mirror by industrial x-ray computed tomography;Advances in Metrology for X-Ray and EUV Optics VIII;2019-09-09

2. System Development for Fabricating Mandrel of Soft X-ray Rotating-Body Mirror (1st Report);Journal of the Japan Society for Precision Engineering;2017

3. Two-stage reflective optical system for achromatic 10 nm x-ray focusing;Journal of Physics B: Atomic, Molecular and Optical Physics;2015-10-28

4. Ptychographic phase retrieval method for characterizing ultra-precise ellipsoidal mirrors;SPIE Proceedings;2015-10-12

5. Development of ellipsoidal focusing mirror for soft x-ray and extreme ultraviolet light;SPIE Proceedings;2015-08-26

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