Resolution limit of label-free far-field microscopy
Author:
Affiliation:
1. Purdue University, School of Electrical Engineering, Birck Nanotechnology Center, West Lafayette, In
Publisher
SPIE-Intl Soc Optical Eng
Reference38 articles.
1. Near-Field Imaging of Free Carriers in ZnO Nanowires with a Scanning Probe Tip Made of Heavily Doped Germanium
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