Adaptive automatic data analysis in full-field fringe-pattern-based optical metrology-Reference-Cited by-同舟云学术

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Adaptive automatic data analysis in full-field fringe-pattern-based optical metrology

Published:2016-12-23 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Trusiak Maciej¹,Patorski Krzysztof¹,Sluzewski Lukasz¹,Pokorski Krzysztof¹,Sunderland Zofia¹

Affiliation:

1. Warsaw Univ. of Technology (Poland)

Publisher

SPIE

Reference70 articles.

1. IV Advanced Evaluation Techniques in Interferometry

2. Optical Shop Testing

3. Robinson, D. and Read, G., eds., [Interferogram Analysis: Digital Fringe Pattern Measurement] (Institute of Physics, 1993).

4. Malacara, D., Servin, M. and Malacara, Z., [Interferogram Analysis for Optical Testing], Marcel Dekker (1998).

5. Fringe projection techniques: Whither we are?

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Simplified paraboloid phase model-based phase tracker for demodulation of a single complex fringe;Applied Optics;2017-08-30

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