High frequency guided wave defect imaging in monocrystalline silicon wafers

Author:

Simon Mathieu,Masserey Bernard,Robyr Jean-Luc,Fromme Paul

Publisher

SPIE

Reference30 articles.

1. [Handbook of Photovoltaic Science and Engineering];Luque,2011

2. Review of Microcrack Detection Techniques for Silicon Solar Cells

3. Physical Science International Journal

4. Standing on the shoulders of giants: An example of guided wave inspection;Rose;Mat. Eval.,2002

5. Feature-guided waves for monitoring adhesive shear modulus in bonded stiffeners

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. High-Frequency Guided Wave Propagation and Scattering in Silicon Wafers;Journal of Nondestructive Evaluation, Diagnostics and Prognostics of Engineering Systems;2021-06-01

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