Optical micro-scanning zero calibration for a thermal microscope imaging system-Reference-Cited by-同舟云学术

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Optical micro-scanning zero calibration for a thermal microscope imaging system

Published:2016-11-01 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Gao Mei-Jing¹,Jie Xu¹,Tan Ai-Ling¹,Wu Wei-Long¹

Affiliation:

1. Yanshan Univ. (China)

Publisher

SPIE

Reference10 articles.

1. IR Imaging of Integrated Circuit Power Transistors During Operation;Wang,2002

2. Design and performance of a high sensitivity high resolution thermal video system;Forsthoefel,2001

3. Application of Optical Methods in Microelectronics Packaging;Li;J Exp Med,2007

4. Design and implementation of optical micro-scanning thermal microscope imaging system with high resolution;Gao;Chinese Journal of Scientific Instrument,2009

5. Thermal microscope imaging system for semiconductor device and IC invalidation analysis;Gao,2008

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