Transmission ellipsometry of transparent-film transparent-substrate systems: closed-form inversion for the film optical constant-Reference-Cited by-同舟云学术

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Transmission ellipsometry of transparent-film transparent-substrate systems: closed-form inversion for the film optical constant

Published:2006-05-05 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Polarization: Measurement, Analysis, and Remote Sensing VII
language:
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Author:

Zaghloul A. R. M.,Elshazly-Zaghloul M.,Zaghloul Y. A.

Publisher

SPIE

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Single-instrument morphology: single-element polarizer (SEP) ellipsometers, reflecsometers, elliptometers, and reflectometers;SPIE Proceedings;2014-05-21

2. Real-time combined reflection and transmission ellipsometry for film-substrate systems;SPIE Proceedings;2013-09-27

3. Single-angle-of-incidence single-element rotating-polarizer (Single SERP) ellipsometer for film-substrate systems;SPIE Proceedings;2013-09-27

4. Thin-film coatings--a transmission ellipsometric function approach:
I Nonnegative transmission systems, polarization devices, coatings, and closed-form design formulas;Applied Optics;2006-12-10

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