Characterization of non-conductive materials using field emission scanning electron microscopy-Reference-Cited by-同舟云学术

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Characterization of non-conductive materials using field emission scanning electron microscopy

Published:2016-01-26 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
Short-container-title:

Author:

Cao Cong,Gao Ran,Shang Huayan,Peng Tingting

Publisher

SPIE

Reference11 articles.

1. Development of Modern SEM and its Application in Material Science;L.,2005

2. Research on Soft Clay by Using Scanning Electron Microscopy and X-ray Spectrometer;Y.,2010

3. [Practical Electron Microscope];B.,2008

4. [Scanning Electron Microscope and Energy Dispersive Spectrometer Analysis Technology];D.,2009

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