Real-world abnormal event detection via super-resolution and few-shot learning
-
Published:2023-05-10
Issue:03
Volume:32
Page:
-
ISSN:1017-9909
-
Container-title:Journal of Electronic Imaging
-
language:
-
Short-container-title:J. Electron. Imag.
Author:
Xia Limin1,
Wei Changhong1
Affiliation:
1. Central South University, School of Automation, Changsha, China
Publisher
SPIE-Intl Soc Optical Eng
Subject
Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics