Ellipsometry on optically thin palladium films on silicon-based substrate: effects of low concentration of hydrogen
Author:
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference8 articles.
1. F. A. Lewis,In the Palladium/Hydrogen System, Academic Press, New York (1967).
2. Activation of hydrogen sensitive palladium-oxide-semiconductor structures studied with simultaneous ellipsometric and capacitance measurements
3. Temperature-induced reflectivity changes and activation of hydrogen sensitive optically thin palladium films on silicon oxide
4. Optically thin palladium films on silicon-based substrates and nanostructure formation: effects of hydrogen
5. Characterization of reflectivity inversion, α- and β-phase transitions and nanostructure formation in hydrogen activated thin Pd films on silicon based substrates
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