Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference10 articles.
1. J. Janesick,Scientific Charge-Coupled Devices, SPIE Press, Bellingham, WA (2001).
2. T. Lule, S. Benthien, H. Keller, F. Mutze, P. Rieve, K. Seibel, M. Sommer, and M. Bohm, “Sensitivity of CMOS based imagers and scaling perspectives,”IEEE Trans. Electron Devices47(11) (2000).
3. B. Pain et al., “Analysis and enhancement of low-light-level performance of photodiode-type CMOS active pixel imagers operated with sub-threshold reset,” inProc. 1999 IEEE Workshop on CCDs and AIS, Nagano, Japan (1999).
4. H. Tian, B. Fowler, and A. Gamal, “Analysis of temporal noise in CMOS photodiode active pixel sensor,”IEEE J. Solid-State Circuits36(1) (2001).
5. Low-noise readout using active reset for CMOS APS
Cited by
28 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献