Fluorescent microscopy of wet-cleaned surfaces: imaging of water stains distribution-Reference-Cited by-同舟云学术

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Fluorescent microscopy of wet-cleaned surfaces: imaging of water stains distribution

Published:2003-07-01 Issue:7 Volume:42 Page:2051
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Yakovlev V. V.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference23 articles.

1. V. Yakovlev, K. Mikhaylichenko, and M. Ravkin, U.S. Patent No. 09/752,609 pending (2000).

2. K. Mikhaylichenko, M. Ravkin, and V. Yakovlev, U.S. Patent No. 09/752,697 pending (2000).

3. Atomic Scale Morphology of Hydrogen-Terminated Si(100) Surfaces Studied by Fourier-Transform Infrared Attenuated Total Reflection Spectroscopy and Scanning Probe Microscopies

4. A Spectro-Microscopic Approach to Study the Morphology and Elemental Distribution of mc-Si Surfaces

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Image Processing for Solar Cell Analysis, Diagnostics and Quality Assurance Inspection;Handbook of Research on Solar Energy Systems and Technologies

2. Image Processing for Solar Cell Analysis, Diagnostics and Quality Assurance Inspection;Image Processing

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