CCD-based thermoreflectance imaging of high-power diode lasers with back-irradiance-Reference-Cited by-同舟云学术

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CCD-based thermoreflectance imaging of high-power diode lasers with back-irradiance

Published:2018-05-04 Issue: Volume: Page:
ISSN:
Container-title:Laser Technology for Defense and Security XIV
language:
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Author:

Leisher Paul,Deri Robert,Thiagarajan Prabhu,Li Chen,Pipe Kevin,Cao Chuanshun

Publisher

SPIE

Reference16 articles.

1. Temperature-power dependence of catastrophic optical damage in AlGaInP laser diodes;Sanayeh,2007

2. Investigation of dark line defects induced by catastrophic optical damage in broad-area AlGaInP laser diodes;Sanayeh,2006

3. Catastrophic Degradation in GaAs Injection Lasers

4. How does external feedback cause AlGaAs-based diode lasers to degrade?

5. The impact of external optical feedback on the degradation behavior of high-power diode lasers;Hempel,2013

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