Flight track pattern recognition based on few labeled data with outliers-Reference-Cited by-同舟云学术

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Flight track pattern recognition based on few labeled data with outliers

Published:2021-01-05 Issue:03 Volume:30 Page:
ISSN:1017-9909
Container-title:Journal of Electronic Imaging
language:
Short-container-title:J. Electron. Imag.

Author:

Fan Yuqi¹,Shen Guangming¹,Xu Xiong²,Xu Juan¹,Yuan Xiaohui³

Affiliation:

1. Hefei University of Technology, School of Computer Science and Information Engineering, Hefei, Anhui

2. State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information S

3. University of North Texas, Department of Computer Science and Engineering, Denton, Texas

Funder

National Natural Science Foundation of China

Publisher

SPIE-Intl Soc Optical Eng

Subject

Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics

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