Ratiometric wavelength monitor based on Mach-Zehnder interferometer over a 80nm wavelength range-Reference-Cited by-同舟云学术

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Ratiometric wavelength monitor based on Mach-Zehnder interferometer over a 80nm wavelength range

Published:2018-12-12 Issue: Volume: Page:
ISSN:
Container-title:Optical Precision Manufacturing, Testing, and Applications
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Author:

Zhao Hui,Song Guangyi,Wang Shuxin,Lang Tingting,He Jianjun

Publisher

SPIE

Reference12 articles.

1. A design method for a ratiometric wavelength monitor using a pair of directional couplers acting as edge filters;Hatta,2008

2. Ratiometric wavelength monitor based on X-type spectral response using two edge filters;Hatta,2009

3. Practical fiber-optic Bragg grating strain gauge system

4. A CMOS-compatible silicon photonic platform for high-speed integrated opto-electronics

5. Dual Mach-Zehnder Based Integrated X-Type Ratiometric Wavelength Monitor on Glass

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Integrated Ultrahigh-Sensitivity Temperature Sensor Based on Asymmetric Mach–Zehnder Interferometer and Stress Deformation of Aluminum-SiO2;IEEE Transactions on Instrumentation and Measurement;2021

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