Author:
Li Chen,Yang Yongying,Cao Pin,Wang Shitong,Liu Dong,Li Lu,Yan Lu,Li Yang,Xie Shibing,Chen Yangjie
Reference11 articles.
1. Recent developments in surface roughness characterization
2. Numerical simulation of laser-induced damage on rear surface of optical material;Hua,2009
3. Total internal reflection microscopy: a subsurface defects identification technique in optically transparent components;YAN,2009
4. Microscopic scattering imaging measurement and digital evaluation system of defects for fine optical surface
5. Microscopic dark-field scattering imaging and digitalization evaluation system of defects on optical devices precision surface;Yang,2007