Polarizing phase shifting interferometry of total internal reflection light for measurement of refractive index and its spatial variation in liquid samples-Reference-Cited by-同舟云学术

Polarizing phase shifting interferometry of total internal reflection light for measurement of refractive index and its spatial variation in liquid samples

Published:2016-07-19 Issue:7 Volume:55 Page:077102
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Das Tania¹,Bhattacharya Kallol²

Affiliation:

1. Heritage Institute of Technology, Department of Electronics and Communication Engineering, Chowbaga Road, Anandapur, Kolkata, West Bengal 700107, India

2. University of Calcutta, Department of Applied Optics and Photonics, JD-2, Sector – III, Salt Lake, Kolkata 700098, India

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference8 articles.

1. Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

2. Theory and analysis of phase sensitivity-tunable optical sensor based on total internal reflection

3. Surface Plasmon Resonance Sensors for Detection of Chemical and Biological Species

4. Development of Phase Detection Schemes Based on Surface Plasmon Resonance Using Interferometry

5. A Method for Measuring the Three-Dimensional Refractive-Index Distribution of Single Cells Using Proximal Two-Beam Optical Tweezers and a Phase-Shifting Mach—Zehnder Interferometer

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3. Quantitative Estimation of Spatially Varying Refractive Index in Optical Fibre Preform;Springer Proceedings in Physics;2020

4. Temporal Polarization Phase-shifting for Digital Speckle Pattern Interferometry;Instruments and Experimental Techniques;2019-08-06

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