The resolution enhancement lithography assisted by chemical shrink based on KrF lithography technology

Author:

Shi-Li Xiang,Jun Liu,Hao Linpo,Shao Chuanyu

Publisher

SPIE

Reference5 articles.

1. Advanced Micro-Lithography Process for i-line Lithography

2. 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)

3. 0.1/spl mu/m level contact hole pattern formation with KrF lithography by resolution enhancement lithography assisted by chemical shrink (RELACS);Toyoshima,1998

4. Advanced RELACS Technology for ArF Resist

5. Advanced Micro-Lithography Process with Chemical Shrink Technology;Ishibashi;Japanese Journal of Applied Physics,2001

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