Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography
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SPIE
Reference21 articles.
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1. Revealing misfit dislocations in InAsxP1−x-InP core–shell nanowires by x-ray diffraction;Nanotechnology;2019-09-27
2. Role of the strained substrate in the x-ray diffraction of free-standing epitaxial nanostructures under grazing incidence conditions;Physical Review B;2019-05-17
3. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography;Nano Letters;2018-01-24
4. X-ray Bragg Ptychography on a Single InGaN/GaN Core–Shell Nanowire;ACS Nano;2017-03-20
5. Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films;Physical Review A;2016-10-04
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