Metrological characterization of 3D imaging devices-Reference-Cited by-同舟云学术

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Metrological characterization of 3D imaging devices

Published:2013-05-23 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
language:
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Author:

Guidi G.

Publisher

SPIE

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metrological characterisation of tool pre-setting optical systems based on 2D imaging;Measurement;2024-03

2. VDI/VDE 2634–1 performance evaluation tests and systematic errors in passive stereo vision systems;Precision Engineering;2023-01

3. METROLOGICAL CHARACTERIZATION OF OPTICAL 3D COORDINATE MEASUREMENT SYSTEMS – COMPARISON OF ALTERNATIVE HARDWARE DESIGNS AS PER ISO 10360;The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences;2022-12-08

4. Metrology Benchmarking of 3D Scanning Sensors Using a Ceramic GD&T-Based Artefact;Sensors;2022-11-08

5. Systematic method for evaluating the performance of three-dimensional optical scanners by structured light projection applied to ballistic vests tests;MEASUREMENT;2022

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