Determination of the normalized surface height autocorrelation function of a two-dimensional randomly rough dielectric surface by the inversion of light scattering data in p-polarization-Reference-Cited by-同舟云学术

Determination of the normalized surface height autocorrelation function of a two-dimensional randomly rough dielectric surface by the inversion of light scattering data in p-polarization

Published:2016-09-26 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Kryvi J. B.¹,Simonsen I.¹,Maradudin A. A.²

Affiliation:

1. NTNU Norwegian Univ. of Sciences and Technology (Norway)

2. Univ. of California, Irvine (United States)

Publisher

SPIE

Reference11 articles.

1. Determination of the normalized surface height autocorrelation function of a two-dimensional randomly rough dielectric surface by the inversion of light scattering data;Simonsen,2016

2. A reciprocal phase-perturbation theory for rough-surface scattering

3. Perturbation theory results for the diffuse scattering of light from two-dimensional randomly rough metal surfaces

4. Vector theory of light scattering from a rough surface: Unitary and reciprocal expansions

5. I. Simonsen, J.B. Kryvi, and A. A. Maradudin, unpublished work, 2016.

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2. Nonparametric reconstruction of the statistical properties of penetrable, isotropic randomly rough surfaces from in-plane, co-polarized light scattering data: Application to computer-generated and experimental scattering data;Physical Review A;2021-10-04