Simultaneously measuring the refractive index and thickness of an optical sample by using improved fiber-based optical coherence tomography-Reference-Cited by-同舟云学术

Simultaneously measuring the refractive index and thickness of an optical sample by using improved fiber-based optical coherence tomography

Published:2014-04-11 Issue:4 Volume:53 Page:044108
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Yen Chih-Ta¹,Huang Jen-Fa²,Wu Ming-Jia³,Lee Yu-Fan³,Huang Chia-Tsai⁴,Huang Shu-Fan⁴,Cheng Hsu-Chih³

Affiliation:

1. National Formosa University, Department of Electrical Engineering, No. 64, Wunhua Road, Huwei Township, Yunlin County 632, Taiwan

2. National Cheng Kung University, Institute of Computer and Communications Engineering, Advanced Optoelectronic Technology Center, Department of Electrical Engineering, Tainan, Taiwan

3. National Formosa University, Department of Electro-Optical Engineering, No. 64, Wunhua Road, Huwei Township, Yunlin County 632, Taiwan

4. National Cheng Kung University, Institute of Electro-Optic Science and Engineering, Advanced Optoelectronic Technology Center, Department of Photonics, Tainan, Taiwan

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

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