Subpixel edge localization with reduced uncertainty by violating the Nyquist criterion-Reference-Cited by-同舟云学术

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Subpixel edge localization with reduced uncertainty by violating the Nyquist criterion

Published:2014-06-27 Issue:12 Volume:53 Page:122410
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Heidingsfelder Philipp¹,Gao Jun²,Wang Kun³,Ott Peter¹

Affiliation:

1. Heilbronn University, Institute for Mechatronics, Optical Engineering Lab, Max-Planck-Str. 39, Heilbronn 74081, Germany

2. Hefei University of Technology, School of Computer and Information, Tunxi Road 193, Hefei, Anhui 230009, China

3. Hefei University of Technology, Department of Instrument Science and Opto-electronics Engineering, Tunxi Road 193, Hefei, Anhui 230009, China

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference22 articles.

1. How small should pixel size be?

2. Resolution and light sensitivity tradeoff with pixel size

3. Roadmap for CMOS image sensors: Moore meets Planck and Sommerfeld

4. Psychophysical thresholds and digital camera sensitivity: the thousand-photon limit

5. Mobile Imaging: the big challenge of the small pixel

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