Holographic Fringe Linearization Interferometry For Defect Detection-Reference-Cited by-同舟云学术

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Holographic Fringe Linearization Interferometry For Defect Detection

Published:1985-08-01 Issue:5 Volume:24 Page:
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Reynolds G. O.,Servaes D. A.,Ramos-Izquierdo L.,DeVelis J. B.,Peirce D. C.,Hilton P. D.,Mayville R. A.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Methods and Applications of Optical Holography;Materials Science;2011-11-24

2. THE USE OF CARRIER FRINGES AND FFT IN HOLOGRAPHIC NONDESTRUCTIVE TESTING;Experimental Techniques;2001-07

3. Color holographic interferometry;Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids;1999-10-13

4. Rigid-body-motion-assisted holographic interferometry;Journal of Optics;1998-12

5. Application of the holographic carrier fringe and FFT technique for deformation measurement;Optics & Laser Technology;1996-02

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