Author:
Heng Fook-Luen,Lee Jin-Fuw,Gupta Puneet
Cited by
13 articles.
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1. Hardware-corroborated Variability-Aware SRAM Methodology;2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems;2013-01
2. Variations: Sources and Characterization;Low-Power Variation-Tolerant Design in Nanometer Silicon;2010-10-25
3. Electrical assessment of lithographic gate line-end patterning;Journal of Micro/Nanolithography, MEMS, and MOEMS;2010-04-01
4. Modeling and Analysis of the Nonrectangular Gate Effect for Postlithography Circuit Simulation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2010-04
5. Electrical Modeling of Lithographic Imperfections;2010 23rd International Conference on VLSI Design;2010-01