Reliability of oxide VCSELs at Emcore-Reference-Cited by-同舟云学术

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Reliability of oxide VCSELs at Emcore

Published:2004-06-16 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Helms Christopher J.,Aeby Ian,Luo Wenlin,Herrick Robert W.,Yuen Albert

Publisher

SPIE

Cited by 41 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Oxide-confined GaAs-based vertical-cavity surface-emitting laser: Measurement and modeling of the strain field;Journal of Applied Physics;2023-04-13

5. 垂直腔面发射激光器中位错形成及扩展特性分析;Laser & Optoelectronics Progress;2023

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