Reliability and manufacturability of 850 nm 50 Gbit/s PAM-4 vertical-cavity surface-emitting lasers-Reference-Cited by-同舟云学术

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Reliability and manufacturability of 850 nm 50 Gbit/s PAM-4 vertical-cavity surface-emitting lasers

Published:2018-11-15 Issue: Volume: Page:
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Container-title:Tenth International Conference on Information Optics and Photonics
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Author:

Lang Luguang,Wang Zhiyong,zhou Guangzheng,Li Ying,Yu Hongyan,Lv Zhaochen,Lan Tian,Liu Xuesheng

Publisher

SPIE

Reference11 articles.

1. 28 Gbps 850 nm Oxide VCSEL Development and Manufacturing Progress at Avago;Thomas,2014

2. 50Gb/s PAM-4 Oxide VCSEL Development Progress at Broadcom;Jingyi,2017

3. 112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center Interconnects;Fotini,2016

4. Reliability and Manufacturability of 25G VCSELs with Oxide Apertures Formed by in-situ Monitoring;James,2017

5. Impact of Photon Lifetime on the Temperature Stability of 50 Gb/s 980 nm VCSELs

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