Impact of nanocrystal(s) location on C-V-t and I-V-t characteristics of ncMOS structures
Author:
Affiliation:
1. Warsaw Univ. of Technology (Poland)
Publisher
SPIE
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1. Comparison of memory effect with voltage or current charging pulse bias in MIS structures based on codoped Si-NCs embedded in SiO2 or HfOx;Solid-State Electronics;2019-09
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