A novel defect detection technique based on automatic detection of potential background-Reference-Cited by-同舟云学术

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A novel defect detection technique based on automatic detection of potential background

Published:2016-04-01 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Aminzadeh Masoumeh¹,Kurfess Thomas¹

Affiliation:

1. Georgia Institute of Technology (United States)

Publisher

SPIE

Reference8 articles.

1. Machine Vision; Automated Visual Inspection and Robot Vision;Vernon,1991

2. Computer Vision;Shapiro,2001

3. Statistical Tools for Weld Defect Evaluation in Radiographic Testing;Nacereddine,2006

4. Selected algorithms of background generation used for flaw detection in welded joints;Chady,2008

5. NDE X-ray image analysis using mathematical morphology;Chackalackal,1990

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