Optical residual stress measurement in TFT-LCD panels

Author:

Wang Wei-Chung1,Sung Po-Chi1

Affiliation:

1. National Tsing Hua Univ. (Taiwan)

Publisher

SPIE

Reference4 articles.

1. Wang, W.C., Huang, C.H., Sung, P.C., Chen, W.R., and Lai, G.T., “Apparatus for quantifying unknown stress and residual stress of a material and method thereof,” United States Patent, Patent Number: 8780348, Application Date: 18 September 2012, Issue Date: 15 July 2014.

2. Investigation of systematic relationship between spectrometry and white light photoelasticity by regression analysis

3. Sung, P.C., Wang, W.C. and Lu, Z.Y., “A correction theory of stress determination of glass plate in reflection photoelasticity,” 17th International Conference on Experimental Mechanic 308, 1–2 (2016).

4. Wang, W.C., Sung, P.C., Lu, Z.Y., Yeh Y.L. and Chen P.Y., “A stress measurement method of optical materials and system thereof” Taiwan Invention Patent, Application Number: 105140876, Application Date: 09 December 2016.

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