Author:
Hoghoj Peter,Joensen Karsten D.,Christensen Finn E.,Susini Jean,Ziegler Eric,Freund Andreas K.,Lueken E.,Riekel Christian
Cited by
5 articles.
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1. Laboratory-based x-ray reflectometer for multilayer characterization in the 15–150 keV energy band;Review of Scientific Instruments;2015-04
2. Design of X-ray supermirrors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-03
3. Metal/Al2O3 multilayers: Interface structure, thermal stability and reflectivities in the soft x-ray regime;Journal of Applied Physics;1998-09-15
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