<title>New imaging mode in atomic-force microscopy based on the error signal

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New imaging mode in atomic-force microscopy based on the error signal

Published:1992-05-01 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Putman Constant A.,van der Werf Kees O.,de Grooth Bart G.,van Hulst Niko F.,Greve Jan,Hansma Paul K.

Publisher

SPIE

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