Author:
Parsons Steven,Hall David J.,Holland Andrew D.,Verhoeve Peter,Sembay Steven,Randall George,Hetherington Oliver,Yeoman Dean,Buggey Thomas W.,Soman Matthew R.
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1 articles.
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1. Short-term trap decay in a cryogenically irradiated charge-coupled device;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03