Author:
Simon M.,Reznikova E.,Nazmov V.,Last A.,Jark W.
Cited by
8 articles.
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1. The SKIF X–Techno Beamline Project;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-12
2. A large field-of-view high-resolution hard x-ray microscope using polymer optics;Review of Scientific Instruments;2020-11-01
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4. Deep 3D X-ray Lithography Based on High-Contrast Resist Layers;Technical Physics Letters;2019-09
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