Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference26 articles.
1. Speckle Metrology, R. S. Sirohi , Ed., Marcel Dekker, Inc., New York (1993).
2. P. K. Rastogi ,Digital Speckle Pattern Interferometry and Related Techniques, John and Wiley and Sons Ltd., Chichester, UK (2001).
3. Optical constant determination of thin films: an analytical solution
4. Millisecond phase acquisition at video rates
5. Instantaneous Phase Measuring Interferometry
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献