At-wavelength optical metrology development at the ALS-Reference-Cited by-同舟云学术

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At-wavelength optical metrology development at the ALS

Published:2010-08-19 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Yuan Sheng,Goldberg Kenneth A.,Yashchuk Valeriy V.,Celestre Richard,Mochi Iacopo,Macdougall James,Morrison Gregory Y.,Smith Brian V.,Domning Edward E.,McKinney Wayne R.,Warwick Tony

Publisher

SPIE

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements;Journal of Synchrotron Radiation;2024-07-29

2. Optics metrology and at-wavelength wavefront characterization by a microfocus X-ray grating interferometer;Optics Express;2021-07-02

3. X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source;Advances in Metrology for X-Ray and EUV Optics IX;2020-08-25

4. Fish Roe Polypeptide Exerts Hypoglycemia Activity via Regulating Insulin Secretion Mediated by Nrf2/ERK Signaling;International Journal of Peptide Research and Therapeutics;2020-08-18

5. Optimized alignment of X-ray mirrors with an automated speckle-based metrology tool;Review of Scientific Instruments;2019-02

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