Radiation effects on scientific complementary metal-oxide-semiconductor detectors for x-ray astronomy: II. Total ionizing dose irradiation-Reference-Cited by-同舟云学术

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Radiation effects on scientific complementary metal-oxide-semiconductor detectors for x-ray astronomy: II. Total ionizing dose irradiation

Published:2024-04-04 Issue:02 Volume:10 Page:
ISSN:2329-4124
Container-title:Journal of Astronomical Telescopes, Instruments, and Systems
language:
Short-container-title:J. Astron. Telesc. Instrum. Syst.

Author:

Chen Mengxi¹,Ling Zhixing¹,Liu Mingjun¹,Wu Qinyu¹,Zhang Chen¹,Liu Jiaqiang²,Zhang Zhenlong³,Yuan Weimin¹,Zhang Shuang-Nan¹

Affiliation:

1. Chinese Academy of Sciences, National Astronomical Observatories, Beijing, China

2. Chinese Academy of Sciences, National Space Science Center, Beijing, China

3. University of Chinese Academy of Sciences, School of Astronomy and Space Sciences, Beijing, China

Publisher

SPIE-Intl Soc Optical Eng

Reference27 articles.

1. Continuous measurement of radiation damage of standard CMOS imagers

2. DEVELOPMENTS AND APPLICATIONS OF HIGH-PERFORMANCE CCD AND CMOS IMAGING ARRAYS

3. Characterization of gamma-ray-induced radiation effects on a commercial CMOS sensor for x-ray small satellites

4. High-energy proton radiation damage experiment on a hybrid CMOS detector

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