Optical ray tracing of echelle spectrographs applied to the wavelength solution for precise radial velocities-Reference-Cited by-同舟云学术

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Optical ray tracing of echelle spectrographs applied to the wavelength solution for precise radial velocities

Published:2024-04-01 Issue:02 Volume:10 Page:
ISSN:2329-4124
Container-title:Journal of Astronomical Telescopes, Instruments, and Systems
language:
Short-container-title:J. Astron. Telesc. Instrum. Syst.

Author:

Pinto Marcelo Tala¹,Kaminski Adrian²,Quirrenbach Andreas²,Zechmeister Mathias³

Affiliation:

1. Universidad Adolfo Ibáñez, Facultad de Ingeniería y Ciencias, Santiago, Chile

2. Zentrum für Astronomie der Universität Heidelberg, Landessternwarte, Heidelberg, Germany

3. Georg-August-Universität, Institut für Astrophysik und Geophysik, Göttingen, Germany

Publisher

SPIE-Intl Soc Optical Eng

Reference33 articles.

1. Modeling echelle spectrographs

2. Stis calibration enhancement (stis-ce): dispersion solutions based on a physical instrument model;Kerber,2006

3. Model based wavelength calibration for CRIRES

4. Using the X-shooter physical model to understand instrument flexure

5. Modelling high resolution Echelle spectrographs for calibrations: Hanle Echelle spectrograph, a case study

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