Elastic characterization of nanometer-thick polymeric film for astrophysics application with an experimental-numerical method-Reference-Cited by-同舟云学术

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Elastic characterization of nanometer-thick polymeric film for astrophysics application with an experimental-numerical method

Published:2023-08-18 Issue:03 Volume:9 Page:
ISSN:2329-4124
Container-title:Journal of Astronomical Telescopes, Instruments, and Systems
language:
Short-container-title:J. Astron. Telesc. Instrum. Syst.

Author:

Montinaro Nicola¹,Lo Cicero Ugo²,D’Anca Fabio²,Bozzo Enrico³,Paltani Stéphane³,Barbera Marco²

Affiliation:

1. Università degli Studi di Palermo, Dipartimento di Ingegneria, Palermo, Italy

2. INAF-Osservatorio Astronomico di Palermo, Palermo, Italy

3. Université de Genève, Département d’astronomie, Faculté des sciences, Genève, Switzerland

Publisher

SPIE-Intl Soc Optical Eng

Subject

Space and Planetary Science,Mechanical Engineering,Astronomy and Astrophysics,Instrumentation,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Reference40 articles.

1. ATHENA X-IFU thermal filters development status toward the end of the instrument phase-A

2. Thermal Filters for the ATHENA X-IFU: Ongoing Activities Toward the Conceptual Design

3. ATHENA WFI optical blocking filters development status toward the end of the instrument phase-A

4. The Athena X-ray Integral Field Unit (X-IFU)

5. The Wide Field Imager instrument for Athena

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