Characterization of a femtosecond-laser-produced plasma x-ray source by electronic, optical, and x-ray diagnostic techniques-Reference-Cited by-同舟云学术

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Characterization of a femtosecond-laser-produced plasma x-ray source by electronic, optical, and x-ray diagnostic techniques

Published:1997-10-14 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Gauthier Jean-Claude J.,Bastiani S.,Audebert Patrick,Geindre Jean-Paul,Rousse Antoine,Quoix C.,Grillon G.,Mysyrowicz Andre,Antonetti Andre,Mancini Roberto C.,Shlyaptseva Alla S.

Publisher

SPIE

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hot electrons produced from long scale-length laser-produced droplet plasmas;Laser Physics;2007-04

2. Influence of optical thickness and hot electrons on Rydberg spectra of Ne-like and F-like copper ions;Physical Review E;2003-01-10

3. New sources of ultrashort pulse X-ray radiation and applications;Journal de Physique IV (Proceedings);2002-06

4. A sub-picosecond accumulating streak camera for x-rays;Measurement Science and Technology;2001-10-09

5. Time-resolved femtosecond x-ray diffraction by an ultra-short pulse produced by a laser;Measurement Science and Technology;2001-10-09

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