Dynamic temperature field measurements using a polarization phase-shifting technique-Reference-Cited by-同舟云学术

Dynamic temperature field measurements using a polarization phase-shifting technique

Published:2014-02-28 Issue:11 Volume:53 Page:112202
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Serrano-García David Ignacio¹,Martínez-García Amalia²,Toto-Arellano Noel-Ivan³,Otani Yukitoshi⁴

Affiliation:

1. Centro de Investigaciones en Óptica A.C., León, Gto., MéxicobUtsunomiya University, Center of Optical Research and Education, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan

2. Centro de Investigaciones en Óptica A.C., León, Gto., México

3. Laboratorio de Óptica y Fotónica de la Universidad Tecnológica de Tulancingo, Tulancingo, Hidalgo, México

4. Utsunomiya University, Center of Optical Research and Education, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference27 articles.

1. 4D profile of phase objects through the use of a simultaneous phase shifting quasi-common path interferometer

2. Slope measurement of a phase object using a polarizing phase-shifting high-frequency Ronchi grating interferometer

3. Radial slope measurement of dynamic transparent samples

4. Pixelated phase-mask dynamic interferometer

5. Error-free demodulation of pixelated carrier frequency interferograms

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