Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes

Author:

Kaufmann Guillermo H.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference15 articles.

1. O. J. Løkberg, “Recent developments in video speckle interferometry,” inSpeckle Metrology, R. S. Sirohi, Ed., pp. 157–194, Marcel Dekker, New York (1993).

2. J. M. Huntley, “Automated analysis of speckle interferograms,” inDigital Speckle Pattern Interferometry and Related Techniques, P. K. Rastogi, Ed., pp. 59–139, Wiley and Sons, New York (2001).

3. X. Colonna De Lega, “Continuous deformation measurement using dynamic phase-shifting and wavelet transform,” inApplied Optics and Optoelectronics 1996, K. T. V. Grattan, Ed., pp. 261–267, Institute of Physics Publishing, Bristol (1996).

4. Determination of interferometer phase distributions by use of wavelets

5. M. Carrez, P. Delobelle, and G. Tribillon, “Application of fringe projection and wavelet analysis to the identification of a finite element model: study of the influence of ripening on the mechanical properties of a biologic material,” inInterferometry in Speckle Light, P. Jacquot and J.-M. Fournier, Eds., pp. 614–622, Springer, Berlin (2001).

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