Large stack-yard three-dimensional measurement based on videogrammetry and projected-contour scanning

Author:

Ou Jianliang1,Zhou Jian1,Zhu Xianwei1,Yuan Yun1,Shang Yang1,Zhang Xiaohu1

Affiliation:

1. National Univ. of Defense Technology

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

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