Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers-Reference-Cited by-同舟云学术

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Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers

Published:2002-12-01 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Jacobi Sandra,Steeg Barbara,Wiesmann Jorg,Stormer Michael,Feldhaus Josef,Bormann Rdiger,Michaelsen Carsten

Publisher

SPIE

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stress, Roughness and Reflectivity Properties of Sputter-Deposited B4C Coatings for X-Ray Mirrors*;Chinese Physics Letters;2019-12-01

2. Preparation and characterization of B4C coatings for advanced research light sources;Journal of Synchrotron Radiation;2016-01-01

3. Radiation damage to amorphous carbon thin films irradiated by multiple 46.9 nm laser shots below the single-shot damage threshold;Journal of Applied Physics;2009-05

4. Single-layer and multilayer mirrors for current and next-generation light sources;SPIE Proceedings;2008-08-28

5. Nanoscaled Multilayer Coatings for X‐Ray Optics;Advanced Engineering Materials;2008-07

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