Author:
Stoler Dvori,Ruch Wayne,Ma Weimin,Chakravarty Swapnajit,Liu Steven,Morgan Ray,Valadez John,Moore Bill,Burns John
Cited by
2 articles.
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1. Design-Aware Mask Inspection;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2012-05
2. Design-aware mask inspection;2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD);2010-11