Application of machine learning to x-ray diffraction-based classification-Reference-Cited by-同舟云学术

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Application of machine learning to x-ray diffraction-based classification

Published:2018-05-04 Issue: Volume: Page:
ISSN:
Container-title:Anomaly Detection and Imaging with X-Rays (ADIX) III
language:
Short-container-title:

Author:

Zhao Bi,Greenberg Joel A.,Wolter Scott

Publisher

SPIE

Reference10 articles.

1. Explosives detection systems (EDS) for aviation security

2. Performance estimation for threat detection in ct systems;Montgomery,2017

3. Explosive detection using pixellated X-ray diffraction (PixD)

4. Snapshot molecular imaging using coded energy-sensitive detection

5. Material-identification-free detection based on material-science-informed clustering;Yuan,2017

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Resolution analysis of a volumetric coded aperture X-ray diffraction imaging system;Journal of X-Ray Science and Technology;2024-05-28

2. Interpretable structure-property correlation in X-ray diffraction patterns of HfZrO thin films via machine learning;Japanese Journal of Applied Physics;2024-04-01

3. X-ray Diffraction Data Analysis by Machine Learning Methods—A Review;Applied Sciences;2023-09-04

4. Implementation and validation of X-ray diffraction imaging systems in MC-GPU;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-09

5. 3D x-ray diffraction imaging of optically thin samples;Anomaly Detection and Imaging with X-Rays (ADIX) VII;2022-06-03

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