Author:
Jones Ronald L.,Hu Tengjiao,Lin Eric K.,Wu Wen-li,Casa Diego M.,Orji N. G.,Vorburger Theodore V.,Bolton Patrick J.,Barclay George G.
Cited by
1 articles.
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1. Effect of sample contamination in SEMs on linear size measurements;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2008-10