<title>Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidence

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Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidence

Published:1996-07-19 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Boscolo Alessio,Poletto Luca,Tondello Giuseppe

Publisher

SPIE

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-order laser harmonics detection in the EUV and soft x-ray spectral regions;Review of Scientific Instruments;2001-07

2. Optical performance and characterization of an EUV and soft x-ray test facility;SPIE Proceedings;1999-11-25

3. Characterization of a charge-coupled-device detector in the 1100–014-nm (1-eV to 9-keV) spectral region;Applied Optics;1999-01-01

4. Quantum efficiency measurements of an uncoated CEM in the range 0.14 - 160 nm (9 keV - 8 eV);Pure and Applied Optics: Journal of the European Optical Society Part A;1998-07

5. Comparison between performances of optical gratings and Si-PIN detectors in soft x-ray (2 - 7 keV) spectroscopy;Pure and Applied Optics: Journal of the European Optical Society Part A;1997-01

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